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Phenom ParticleX TC Desktop SEM
Component cleanliness analysis with a multi-purpose desktop SEM.
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Desktop SEM for component cleanliness analysis
The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling technical cleanliness at the microscale.
Materials characterization
A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is simple to operate and fast to learn, opening up particle and material analysis to a wider group of users.
Thermo Scientific Phenom ParticleX TC demo
Insights
See how the Phenom ParticleX TC Desktop SEM performs in the real world with case studies, webinars, and more.
Technical cleanliness analysis with an SEM Why
Technical cleanliness
With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy with energy-dispersive X-ray spectroscopy (EDS). This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407 are available.
Secondary electron detector
A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore the perfect choice to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.
General SEM usage
The user interface is based on the proven ease-of-use technology applied in the successful Phenom desktop SEM products. The interface enables both existing and new users to quickly become familiar with the system with a minimum of training.
Elemental mapping and line scan
For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot.
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Desktop SEM Blogs
Want to unlock the great power of scanning electron microscopy without having to compromise on usability? Enhance your knowledge on Scanning Electron Microscopy and find out how Desktop SEM can optimally support your research in our Phenom Desktop SEM blogs.
Industrial Manufacturing Product Selector
The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application:
Mineral fiber automatically detected and characterized by Phenom ParticleX TC.
Large mineral fiber automatically detected and characterized by Phenom ParticleX TC.
Screenshot Elemental Mapping.
SEM image of smartphone.
SED image taken with Phenom ParticleX.
SEM image of cable.
SEM image of textile.
Alexander Bouman on the new Phenom ParticleX
Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale
Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:
- ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
- ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
- Particle morphology for additive manufacturing feedstocks.
- Workflow examples for particle classifications and reporting.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
Mineral fiber automatically detected and characterized by Phenom ParticleX TC.
Large mineral fiber automatically detected and characterized by Phenom ParticleX TC.
Screenshot Elemental Mapping.
SEM image of smartphone.
SED image taken with Phenom ParticleX.
SEM image of cable.
SEM image of textile.
Alexander Bouman on the new Phenom ParticleX
Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale
Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:
- ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
- ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
- Particle morphology for additive manufacturing feedstocks.
- Workflow examples for particle classifications and reporting.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Technical Cleanliness
More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.
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EDS Elemental Analysis
Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.
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3D EDS Tomography
Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.
Atomic-Scale Elemental Mapping with EDS
Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.
Particle analysis
Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.
EDS Elemental Analysis
Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.
3D EDS Tomography
Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.
Atomic-Scale Elemental Mapping with EDS
Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.
Particle analysis
Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.
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